Prospect and Outlook of Electrostatic Discharge (ESD) Protection in Emerging Technologies
Jeudi 11 décembre 2014 14:00
- Duree : 1 heure
Lieu : Amphi M001, PHELMA, Bât. INP, Minatec
Orateur : Juin J. LIOU (University of Central Florida, Orlando, FL, USA)
Electrostatic discharge (ESD) is one of the most prevalent threats to electronic components. It is an event in which a finite amount of charge is transferred from one object (i.e., human body) to the other (i.e., microchip). This process can result in a very high current passing through the microchip within a very short period of time, and hence more than 35% of chip damages can be attributed to the ESD event. As such, designing on-chip ESD structures to protect integrated circuits against the ESD stress is a high priority in the semiconductor industry. The continuing advancement in semiconductor technology makes the ESD-induced failures even more prominent. In fact, many semiconductor companies worldwide are having difficulties in meeting the increasingly stringent ESD protection requirements for various electronics applications, and one can predict with certainty that the availability of effective and robust ESD protection solutions will become a critical and essential component to the well-being and commercialization of next-generation electronics. An overview on the ESD sources, models, protection schemes, and testing will first be given in this talk. This is followed by the exploration and evaluation of ESD protection solutions in emerging Si nanowire, organic, and GaN technologies. Challenges and difficulties associated with the ESD design and optimization for these technologies will be addressed.
http://imep-lahc.grenoble-inp.fr/events/seminar-by-prof-juin-j-liou—660363.kjsp?RH=IMEP_FR
Contact : bauza@minatec.grenoble-inp.fr
Discipline évènement : (Physique)
Entité organisatrice : (IMEP/LAHC)
Nature évènement : (Séminaire)
Evènement répétitif : (Séminaire IMEP/LAHC)
Site de l'évènement : Site Minatec
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