Super-resolution capacity of imagers using random illuminations

Orateur : Jérôme IDIER (IRCCYN, CNRS, Responsable de l'équipe ADTSI)

For most active wave imaging systems, the recorded data are related to the observed scene via a simple convolution with a point-spread function (PSF). Because of fundamental diffraction limits, in standard configurations, the free-space propagation prevents the wave-field high frequency components to reach the detector. As a result, the Fourier transform of the PSF has a bounded support that ultimately limits the resolution of the imaging system. Thanks to controlled nonuniform illumination patterns, advanced imaging systems such as Structured Illumination Microscopes (SIM) produce a super-resolution effect by shifting high-frequency components of the object into the OTF support. In fluorescence microscopy, several recent papers propose simpler acquisition systems called Blind-SIM, where the illuminations are not controlled. Some empirical results tend to indicate that some super-resolution degree remains achievable. The presentation provides a first mathematical understanding of the super-resolution capacity of Blind-SIM, when the illumination is a speckle noise. Our results cover a wider range of active wave imaging systems, and could have practical consequences in several domains, e.g. fluorescence microscopes, but also anechoic chambers, synthetic apterture radar systems, tomographic diffraction.

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