Local Force measurements and micro/nano-object manipulation by Scanning Force Microscopy
Mardi 2 avril 2013 14:00
- Duree : 1 heure
Lieu : Salle des Séminaires du LMGP (M2-20), 2ème étage, Bât Phelma MINATEC - 3 parvis Louis Néel - 38000 Grenoble
Orateur : Dr. Florence MARCHI (Institut Néel - Nano)
Atomic Force microscopy is a wide spread technique in Nanosciences and Nanotechnology to characterize morphology and/or local interaction of surface sample.
Thanks to a specific mode based on a two-pass procedure, short and long-rangeinteractions can be distinguished at the nanoscale ;it is the more usual mode to perform electrical force microscopy and magnetic force microscopy.
In this seminar I will present some applications of this two-steps detection procedure to study :
- electrical properties of (semi)conductive materials or nanostructuresthat are used in micro/nano-electronic devices ;
- magnetic force induced by an array of micro-magnets on super-paramagnetic objects using custom-made MFM colloidal probe, these micromagnets have great potential applications in biological cellular sorting.
The AFM probe is a powerful nano-sensor, but it can also act as a nanotool to inject electrical charge or manipulate object at the micro and nanoscopic scales. To illustrate this capability, I will focus on (sub)microsphere manipulation in 2D and 3D thanks to a custom-made dual scanning force probes station equipped with a force feedback system.
Finally, I will discuss the potential of these local probe techniques to study physical properties of silver nanowires that have great potential applications in soft electronic devices.
Contact : colette.lartigue@grenoble-inp.fr
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