ADD2016 - School and Conference on Analysis of Diffraction Data in Real Space

Orateur : Plusieurs intervenants

The ADD2016 School and Conference aim to deepen the understanding and to further the training of the various communities working on real-space data analysis for neutron, x-ray and other diffraction techniques. Fourier transformation of diffraction data into real-space, traditionally used for the structural determination of liquids and glasses, has recently seen increasing development in the field of crystalline powder diffraction where it complements the well-known Rietveld refinement of diffraction data. Real-space analysis of total-scattering data is sensitive to local, possibly time-dependent, structural disorder, and therefore enjoys a wide field of application, in particular to nano-structured materials. The 2-day school includes educative lectures and hands-on tutorials as concerns the experimental techniques and software available for real-space analysis of diffraction data. Inmediately after the school, a 2-day conference begins, where presentations on the various scientific areas of application will be given.

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