Beyond Topography : New Advances in AFM Characterization

Orateur : Rafaël BARBATTINI and Julien LOPEZ (Application Scientist and sales engineer - Asylum Research an Oxford Instruments Company)

Whether investigating fundamental research principles or engineering a specific product, the atomic force microscope (AFM) is a key instrument for both materials and life science applications. Its spatial resolution enables visualization of sub-micrometer and sub-nanometer morphology and structure. However, recent advances mean that AFMs can also measure the physical properties and functional behavior of large range of different samples. In addition to familiar topographic imaging, AFMs can probe molecular-level forces, map mechanical, thermal, and electrical properties and assess solvent and thermal effects in near real time. This seminar provides an overview of the AFM’s powerful capabilities for different type of characterization and will cover :

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